Dependence of Blister-Deckeldichte and of Depth Profiles of Implanted He Ions 
in Nb on Angle of Incidence

Risch, M.R.; Roth, J.; Scherzer, B.M.U.

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Dependence of Blister-Deckeldichte and of Depth Profiles of Implanted He Ions in Nb on Angle of Incidence

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Roth, J.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Risch, M., Roth, J., & Scherzer, B. (1979). Dependence of Blister-Deckeldichte and of Depth Profiles of Implanted He Ions in Nb on Angle of Incidence. Journal of Nuclear Materials, 82, 220-226.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-BA67-F

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