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Journal Article

Reduction of Ion Sputtering Yield by Special Surface Microtopography

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Roth,  J.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Ziegler, J., Cuomo, J., & Roth, J. (1977). Reduction of Ion Sputtering Yield by Special Surface Microtopography. Applied Physics Letters, 30, 6, 268-271.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-BB9F-9
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