Surface Characterization by Low-Energy Ion Scattering

Taglauer, E.; LeLay, G.; Derrien, J.; Boccara, N.

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Surface Characterization by Low-Energy Ion Scattering

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Taglauer, E.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Taglauer, E., LeLay, G., Derrien, J., & Boccara, N. (1987). Surface Characterization by Low-Energy Ion Scattering. In Semiconductor Interfaces: Formation and Properties (pp. 150-159).

Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-C005-9

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