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Light-Ion Sputtering Yield Measurements of Ti and TiC under O_sub.2 Exposure at High Temperature

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Santaniello,  A.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Bohdansky,  J.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Roth,  J.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Santaniello, A., Bohdansky, J., & Roth, J. (1989). Light-Ion Sputtering Yield Measurements of Ti and TiC under O_sub.2 Exposure at High Temperature. Journal of Nuclear Materials, 162-164, 951-956.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0028-C1A9-6
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