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Conference Paper

Depth Profiling of D Implanted into Ti at Different Temperatures

MPS-Authors
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Roth,  J.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Eckstein,  W.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Bohdansky,  J.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Roth, J., Eckstein, W., & Bohdansky, J. (1980). Depth Profiling of D Implanted into Ti at Different Temperatures. Ion Beam Modification of Materials, 48, 1679-1695.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-C29D-9
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