Low-Temperature Dynamic Depth Profile Measurements of Implanted Deuterium in 
Nickel: Precipitation of Nickel Deuteride

Petitpierre, O.; Moeller, W.; Scherzer, B.M.U.

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Low-Temperature Dynamic Depth Profile Measurements of Implanted Deuterium in Nickel: Precipitation of Nickel Deuteride

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Moeller, W.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Petitpierre, O., Moeller, W., & Scherzer, B. (1990). Low-Temperature Dynamic Depth Profile Measurements of Implanted Deuterium in Nickel: Precipitation of Nickel Deuteride. Journal of Applied Physics, 68, 7, 3169-3177.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-C4FE-E

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