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Conference Paper

Depth Analysis of Thin Films with an Ion Microprobe

MPS-Authors
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Liebl,  H.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Staudenmaier,  G.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Hofer, W., Liebl, H., & Staudenmaier, G. (1975). Depth Analysis of Thin Films with an Ion Microprobe. In 148. Meeting of the Electrochemical Society (pp. 243).


Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-C87C-1
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