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A High-Performance X-ray Detector for Appearance Potential Spectroscopy

MPS-Authors
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Rangelov,  G.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Ertl,  K.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Vonbank,  M.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Reinmuth,  J.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Donath,  M.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Dose,  V.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;
Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Rangelov, G., Ertl, K., Passek, F., Vonbank, M., Bassen, S., Reinmuth, J., et al. (1998). A High-Performance X-ray Detector for Appearance Potential Spectroscopy. Journal of Vacuum Science and Technology. A, 16, 4, 2738-2741.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-D071-9
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