Topological Characterization of Fractional Quantum Hall Ground States from 
Microscopic Hamiltonians

Zaletel, M. P.; Mong, R. S. K.; Pollmann, F.

doi:10.1103/PhysRevLett.110.236801

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Topological Characterization of Fractional Quantum Hall Ground States from Microscopic Hamiltonians

MPS-Authors

/persons/resource/persons145881

Pollmann, F.
Max Planck Institute for the Physics of Complex Systems, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Zaletel, M. P., Mong, R. S. K., & Pollmann, F. (2013). Topological Characterization of Fractional Quantum Hall Ground States from Microscopic Hamiltonians. Physical Review Letters, 110(23): 236801. doi:10.1103/PhysRevLett.110.236801.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0029-86C6-B

Abstract

There is no abstract available