Power spectrum analysis with least-squares fitting: Amplitude bias and its 
elimination, with application to optical tweezers and atomic force microscope 
cantilevers

Nørrelykke, S. F.; Flyvbjerg, H.

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Power spectrum analysis with least-squares fitting: Amplitude bias and its elimination, with application to optical tweezers and atomic force microscope cantilevers

MPS-Authors

/persons/resource/persons184817

Nørrelykke, S. F.
Max Planck Institute for the Physics of Complex Systems, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Nørrelykke, S. F., & Flyvbjerg, H. (2010). Power spectrum analysis with least-squares fitting: Amplitude bias and its elimination, with application to optical tweezers and atomic force microscope cantilevers. Review of Scientific Instruments, 81(7): 075103.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0029-8ED0-D

Abstract

There is no abstract available