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Nondestructive high-resolution soft-boundary profiling based on forward shadow diffraction

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Shim,  J. B.
Max Planck Institute for the Physics of Complex Systems, Max Planck Society;

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Kim,  S. W.
Max Planck Institute for the Physics of Complex Systems, Max Planck Society;

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Moon, S., Yang, J. H., Lee, S. B., Shim, J. B., Kim, S. W., Lee, J. H., et al. (2008). Nondestructive high-resolution soft-boundary profiling based on forward shadow diffraction. Optics Express, 16(15), 11007-11020.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0029-9494-C
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