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Direct observation of epitaxial organic film growth: temperature-dependent growth mechanisms and metastability

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Marchetto,  Helder
Chemical Physics, Fritz Haber Institute, Max Planck Society;
ELMITEC Elektronenmikroskopie GmbH;

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Schmidt,  Thomas
Chemical Physics, Fritz Haber Institute, Max Planck Society;
Universität Würzburg, Experimentelle Physik;

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Lévesque,  Pierre L.
Chemical Physics, Fritz Haber Institute, Max Planck Society;
Université de Montréal, Département de Chimie;

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Freund,  Hans-Joachim
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Umbach,  Eberhard
Chemical Physics, Fritz Haber Institute, Max Planck Society;
Universität Würzburg, Experimentelle Physik;

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Citation

Marchetto, H., Schmidt, T., Groh, U., Maier, F. C., Lévesque, P. L., Fink, R. H., et al. (2015). Direct observation of epitaxial organic film growth: temperature-dependent growth mechanisms and metastability. Physical Chemistry Chemical Physics, 17(43), 29150-29160. doi:10.1039/C5CP05124J.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0029-1925-6
Abstract
The growth of the first ten layers of organic thin films on a smooth metallic substrate has been investigated in real-time using the model system PTCDA on Ag(111). The complex behaviour is comprehensively studied by electron microscopy, spectroscopy and diffraction in a combined PEEM/LEEM instrument revealing several new phenomena and yielding a consistent picture of this layer growth. PTCDA grows above room temperature in a Stranski–Krastanov mode, forming three-dimensional islands on a stable bi-layer, in competition with metastable 3rd and 4th layers. Around room temperature this growth mode changes into a quasi layer-by-layer growth, while at temperatures below about 250 K a Vollmer–Weber-like behaviour is observed. By means of laterally resolved soft X-ray absorption spectroscopy the orientation of all adsorbed molecules is found to be homogeneously flat lying on the surface, even during the growth process. The films grow epitaxially, showing long-range order with rotational domains. For the monolayer these domains could be directly analysed, showing an average size of several micrometers extending over substrate steps.