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Journal Article

Focused ion beam micromachining enables novel optics for X-ray microscopy

MPS-Authors
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Keskinbora,  K.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Sanli,  U.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Grévent,  C.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Hirscher,  M.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schütz,  G.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Keskinbora, K., Sanli, U., Grévent, C., Hirscher, M., & Schütz, G. (2015). Focused ion beam micromachining enables novel optics for X-ray microscopy. Microscopy and Microanalysis, 21(Suppl 3), 1983-1984. doi:10.1017/S1431927615010697.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0029-B8F6-A
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