Focused ion beam micromachining enables novel optics for X-ray microscopy

Keskinbora, K.; Sanli, U.; Grévent, C.; Hirscher, M.; Schütz, G.

doi:10.1017/S1431927615010697

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Focused ion beam micromachining enables novel optics for X-ray microscopy

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Keskinbora, K.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Sanli, U.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Grévent, C.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Hirscher, M.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schütz, G.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Keskinbora, K., Sanli, U., Grévent, C., Hirscher, M., & Schütz, G. (2015). Focused ion beam micromachining enables novel optics for X-ray microscopy. Microscopy and Microanalysis, 21(Suppl 3), 1983-1984. doi:10.1017/S1431927615010697.

引用: https://hdl.handle.net/11858/00-001M-0000-0029-B8F6-A

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