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Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films using transmission electron microscopy

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Karel,  J.
Julie Karel, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Felser,  C.
Claudia Felser, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Karel, J., Casoli, F., Lupo, P., Nasi, L., Fabbrici, S., Righi, L., et al. (2016). Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films using transmission electron microscopy. Scripta Materialia, 114, 165-169. doi:10.1016/j.scriptamat.2015.11.019.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0029-C6B9-5
Abstract
Tetragonal MnxGa1-x (x = 0.70, 0.75) thin films grown on SrTiO3 substrates exhibit perpendicular magnetic anisotropy with coercive fields between 1 and 2 T. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) reveal that 40 nm samples grown at 300-350 degrees C lead to films with the tetragonal c-axis oriented primarily perpendicular to the film plane but with some fraction of the sample exhibiting the c-axis in the film plane. This structure results in an undesirable secondary magnetic component in the out of plane magnetization. Growth at 300 degrees C with a reduced thickness or Mn concentration significantly decreases the tetragonal c-axis in the film plane. (C) 2015 Elsevier Ltd. All rights reserved.