High-resolution analysis of currents at low-angle grain boundaries in YBCO thin 
films using magnetooptics and magnetic x-ray microscopy

Ruoß, S.; Stahl, C.; Bayer, J.; Schütz, G.; Albrecht, J.; Laviano, F.

doi:10.1109/TASC.2016.2549180

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High-resolution analysis of currents at low-angle grain boundaries in YBCO thin films using magnetooptics and magnetic x-ray microscopy

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Ruoß, S.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Stahl, C.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Bayer, J.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Research Institute for Innovative Surfaces FINO, Aalen University;

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Schütz, G.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Ruoß, S., Stahl, C., Bayer, J., Schütz, G., Albrecht, J., & Laviano, F. (2016). High-resolution analysis of currents at low-angle grain boundaries in YBCO thin films using magnetooptics and magnetic x-ray microscopy. IEEE Transactions on Applied Superconductivity, 26(3): 7500606. doi:10.1109/TASC.2016.2549180.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002A-C4FB-0

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