English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Conference Paper

Velocity Map Imaging of Electrons Strong-Field Photoemitted from Si-Nanotip Arrays

MPS-Authors
/persons/resource/persons195293

Ye,  Hong
International Max Planck Research School for Ultrafast Imaging & Structural Dynamics (IMPRS-UFAST), Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;
Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany;
Department of Physics, University of Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany;

External Ressource
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Ye, H., Kienitz, J. S., Fang, S., Trippel, S., Swanwick, M. E., Keathley, P. D., et al. (2015). Velocity Map Imaging of Electrons Strong-Field Photoemitted from Si-Nanotip Arrays. Springer Proceedings in Physics, 162, 663-666. doi:10.1007/978-3-319-13242-6_163.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002A-5F60-2
Abstract
We observe the electron velocity/momentum distributions due to three-photon ionization and strong-field photoemission from Si-nanotip arrays using velocity map imaging.