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Conference Paper

Velocity Map Imaging of Electrons Strong-Field Photoemitted from Si-Nanotip Arrays

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Ye,  Hong
International Max Planck Research School for Ultrafast Imaging & Structural Dynamics (IMPRS-UFAST), Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;
Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany;
Department of Physics, University of Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany;

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Citation

Ye, H., Kienitz, J. S., Fang, S., Trippel, S., Swanwick, M. E., Keathley, P. D., et al. (2015). Velocity Map Imaging of Electrons Strong-Field Photoemitted from Si-Nanotip Arrays. Springer Proceedings in Physics, 162, 663-666. doi:10.1007/978-3-319-13242-6_163.


Cite as: https://hdl.handle.net/11858/00-001M-0000-002A-5F60-2
Abstract
We observe the electron velocity/momentum distributions due to three-photon ionization and strong-field photoemission from Si-nanotip arrays using velocity map imaging.