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4f excitations in Ce Kondo lattices studied by resonant inelastic x-ray scattering

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Seiro,  S.
Silvia Seiro, Physics of Quantum Materials, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Geibel,  C.
Christoph Geibel, Physics of Quantum Materials, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Krellner,  C.
Physics of Quantum Materials, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Citation

Amorese, A., Dellea, G., Fanciulli, M., Seiro, S., Geibel, C., Krellner, C., et al. (2016). 4f excitations in Ce Kondo lattices studied by resonant inelastic x-ray scattering. Physical Review B, 93(16): 165134, pp. 1-6. doi:10.1103/PhysRevB.93.165134.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002A-C5DD-C
Abstract
The potential of resonant inelastic soft x-ray scattering to measure 4f crystal electric-field excitation spectra in Ce Kondo lattices has been examined. Spectra have been obtained for several Ce systems and show a well-defined structure determined by crystal-field, spin-orbit, and charge-transfer excitations only. The spectral shapes of the excitation spectra can be well understood in the framework of atomic multiplet calculations. For CeCu2Si2 we found notable disagreement between the inelastic x-ray-scattering spectra and theoretical calculations when using the crystal-field scheme proposed from inelastic neutron scattering. Modified sets of crystal-field parameters yield better agreement. Our results also show that, with the very recent improvements of soft x-ray spectrometers in resolution to below 30 meV at the Ce M-4,M-5 edges, resonant inelastic x-ray scattering could be an ideal tool to determine the crystal-field scheme in Ce Kondo lattices and other rare-earth compounds.