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Stimulated Electronic X-Ray Raman Scattering

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Weninger,  Clemens
Max Planck Institute for the Physics of Complex Systems, Max Planck Society;
Center for Free-Electron Laser Science, 22761 Hamburg, Germany;
International Max Planck Research School for Ultrafast Imaging & Structural Dynamics (IMPRS-UFAST), Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;

/persons/resource/persons145791

Rohringer,  Nina
Max Planck Institute for the Physics of Complex Systems, Max Planck Society;
Center for Free-Electron Laser Science, 22761 Hamburg, Germany;
International Max Planck Research School for Ultrafast Imaging & Structural Dynamics (IMPRS-UFAST), Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;

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Citation

Weninger, C., Purvis, M., Ryan, D., London, R. A., Bozek, J. D., Bostedt, C., et al. (2013). Stimulated Electronic X-Ray Raman Scattering. Physical Review Letters, 111(23): 233902. doi:10.1103/PhysRevLett.111.233902.


Cite as: https://hdl.handle.net/11858/00-001M-0000-002A-E284-1
Abstract
We demonstrate strong stimulated inelastic x-ray scattering by resonantly exciting a dense gas target of neon with femtosecond, high-intensity x-ray pulses from an x-ray free-electron laser (XFEL). A small number of lower energy XFEL seed photons drive an avalanche of stimulated resonant inelastic x-ray scattering processes that amplify the Raman scattering signal by several orders of magnitude until it reaches saturation. Despite the large overall spectral width, the internal spiky structure of the XFEL spectrum determines the energy resolution of the scattering process in a statistical sense. This is demonstrated by observing a stochastic line shift of the inelastically scattered x-ray radiation. In conjunction with statistical methods, XFELs can be used for stimulated resonant inelastic x-ray scattering, with spectral resolution smaller than the natural width of the core-excited, intermediate state.