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Untersuchung von Grenzflächen zwischen III-V- und II-VI-Halbleitern mittels Photoemission

MPS-Authors

Wilke,  W. G.
Surface Physics, Fritz Haber Institute, Max Planck Society;

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Wilke, W. G. (1989). Untersuchung von Grenzflächen zwischen III-V- und II-VI-Halbleitern mittels Photoemission. PhD Thesis, Technische Universität, Berlin.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002A-EA99-8
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