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Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells

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Zaefferer,  Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stechmann,  Guillaume
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer, S., & Stechmann, G. (2015). Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells. In K. Wetzig (Ed.), Tagungsband des EFDS Workshops “Morphologie und Mikrostruktur Dünner Schichten und deren Beeinflussung”.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002B-107D-A
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