Surface Layer Investigation Capability with EXLIE Cs-Deposition in NanoSIMS

Hoeschen, C.; Lugmeier, J.; Höschen, T.; Pohl, L.; Meisl, G.; Kögel-Knabner, I.

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Surface Layer Investigation Capability with EXLIE Cs-Deposition in NanoSIMS

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Höschen, T.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Meisl, G.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Hoeschen, C., Lugmeier, J., Höschen, T., Pohl, L., Meisl, G., & Kögel-Knabner, I. (2016). Surface Layer Investigation Capability with EXLIE Cs-Deposition in NanoSIMS. Talk presented at SIMS Europe 2016. Münster. 2016-09-18 - 2016-09-20.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002B-5D9A-3

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