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Beam induced atomic migration at Ag containing nanofacets at an asymmetric Cu grain boundary

MPS-Authors
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Peter,  Nicolas J.
Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kirchlechner,  Christoph
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Liebscher,  Christian
Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Dehm,  Gerhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Peter, N. J., Kirchlechner, C., Liebscher, C., & Dehm, G. (2016). Beam induced atomic migration at Ag containing nanofacets at an asymmetric Cu grain boundary. Poster presented at European Microscopy Congress (EMC) 2016, Lyon, France.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002B-772B-B
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