Dependence of grain sizes and microstrains on annealing temperature in Fe/Pt 
multilayers and L10 FePt thin films

Zotov, N.; Feydt, Jürgen; Ludwig, A.

doi:http://dx.doi.org/10.1016/j.tsf.2008.06.062

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Dependence of grain sizes and microstrains on annealing temperature in Fe/Pt multilayers and L10 FePt thin films

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Feydt, Jürgen
Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society;

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http://www.sciencedirect.com/science/article/pii/S0040609008007050
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Zotov, N., Feydt, J., & Ludwig, A. (2008). Dependence of grain sizes and microstrains on annealing temperature in Fe/Pt multilayers and L10 FePt thin films. Thin Solid Films, 517, 531-537. doi:http://dx.doi.org/10.1016/j.tsf.2008.06.062.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002B-A841-0

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