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Dependence of grain sizes and microstrains on annealing temperature in Fe/Pt multilayers and L10 FePt thin films

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Feydt,  Jürgen
Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society;

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Zotov, N., Feydt, J., & Ludwig, A. (2008). Dependence of grain sizes and microstrains on annealing temperature in Fe/Pt multilayers and L10 FePt thin films. Thin Solid Films, 517, 531-537. doi:http://dx.doi.org/10.1016/j.tsf.2008.06.062.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002B-A841-0
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