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Stacking sequence and interlayer coupling in few-layer graphene revealed by in situ imaging

MPS-Authors
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Wang,  Zhu-Jun
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Timpe,  Olaf
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Schlögl,  Robert
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons22243

Willinger,  Marc Georg
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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ncomms13256.pdf
(Publisher version), 3MB

Supplementary Material (public)

SI-Stacking-Sequence-Graphene-revised-31.pdf
(Supplementary material), 1005KB

Citation

Wang, Z.-J., Dong, J., Cui, Y., Eres, G., Timpe, O., Fu, Q., et al. (2016). Stacking sequence and interlayer coupling in few-layer graphene revealed by in situ imaging. Nature Communications, 7: 13256. doi:10.1038/ncomms13256.


Cite as: https://hdl.handle.net/11858/00-001M-0000-002C-16A1-9
Abstract
In the transition from graphene to graphite, the addition of each individual graphene layer modifies the electronic structure and produces a different material with unique properties. Controlled growth of few-layer graphene is therefore of fundamental interest and will provide access to materials with engineered electronic structure. Here we combine isothermal growth and etching experiments with in situ scanning electron microscopy to reveal the stacking sequence and interlayer coupling strength in few-layer graphene. The observed layer-dependent etching rates reveal the relative strength of the graphene–graphene and graphene–substrate interaction and the resulting mode of adlayer growth. Scanning tunnelling microscopy and density functional theory calculations confirm a strong coupling between graphene edge atoms and platinum. Simulated etching confirms that etching can be viewed as reversed growth. This work demonstrates that real-time imaging under controlled atmosphere is a powerful method for designing synthesis protocols for sp2 carbon nanostructures in between graphene and graphite.