English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
  Local TagsRelease HistoryDetailsSummary

Released
Conference Paper

Direct Reconstruction of Transversally Spinning Electric Fields in Tightly Focused Vector Beams

MPS-Authors
/persons/resource/persons201139

Neugebauer,  Martin
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

/persons/resource/persons201012

Bauer,  Thomas
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

/persons/resource/persons201115

Leuchs,  Gerd
Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

/persons/resource/persons201008

Banzer,  Peter
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Neugebauer, M., Bauer, T., Leuchs, G., & Banzer, P. (2014). Direct Reconstruction of Transversally Spinning Electric Fields in Tightly Focused Vector Beams. 2014 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO).


Cite as: https://hdl.handle.net/11858/00-001M-0000-002D-66AB-4
Abstract
We demonstrate a simple measurement technique for the direct reconstruction of local transversally spinning electric fields in tightly focused vector beams. Our scheme is based on an easy-to-implement difference measurement of intensities in k-space. (C) 2014 Optical Society of America