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Complex source beam: A tool to describe highly focused vector beams analytically

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Orlov,  S.
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

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Peschel,  U.
Nonlinear Optics and Nanophotonics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

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Citation

Orlov, S., & Peschel, U. (2010). Complex source beam: A tool to describe highly focused vector beams analytically. PHYSICAL REVIEW A, 82(6): 063820. doi:10.1103/PhysRevA.82.063820.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002D-6A7B-0
Abstract
The scalar-complex-source model is used to develop an accurate description of highly focused radially, azimuthally, linearly, and circularly polarized monochromatic vector beams. We investigate the power and full beam widths at half maximum of vigorous Maxwell equation solutions. The analytical expressions are employed to compare the vector complex source beams with the real beams produced by various high-numerical-aperture (NA) focusing systems. We find a parameter set for which the spatial extents of the analytical beams are the same as those of experimentally realized ones. We ensure the same shape of the considered beams by investigating an overlap of the complex source beams with high-NA beams. We demonstrate that the analytical expressions are good approximations for realistic highly focused beams.