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Journal Article

Direct experimental observation of the single reflection optical Goos-Hanchen shift

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Schwefel,  H. G. L.
Max Planck Research Group, Max Planck Institute for the Science of Light, Max Planck Society;

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Lu,  Z. H.
Max Planck Fellow Group, Max Planck Institute for the Science of Light, Max Planck Society;

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Wang,  L. J.
Max Planck Research Group, Max Planck Institute for the Science of Light, Max Planck Society;

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Citation

Schwefel, H. G. L., Koehler, W., Lu, Z. H., Fan, J., & Wang, L. J. (2008). Direct experimental observation of the single reflection optical Goos-Hanchen shift. OPTICS LETTERS, 33(8), 794-796. doi:10.1364/OL.33.000794.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002D-6CAC-7
Abstract
We report a precise direct measurement of the Goos-Hanchen shift after one reflection off a dielectric interface coated with periodic metal stripes. The spatial displacement of the shift is determined by image analysis. A maximal absolute shift of 5.18 and 23.39 mu m for TE and TM polarized light, respectively, is determined. This technique is simple to implement and can be used for a large range of incident angles. (C) 2008 Optical Society of America.