English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Direct experimental observation of the single reflection optical Goos-Hanchen shift

MPS-Authors
/persons/resource/persons201188

Schwefel,  H. G. L.
Max Planck Research Group, Max Planck Institute for the Science of Light, Max Planck Society;

/persons/resource/persons60677

Lu,  Z. H.
Max Planck Fellow Group, Max Planck Institute for the Science of Light, Max Planck Society;

/persons/resource/persons201228

Wang,  L. J.
Max Planck Research Group, Max Planck Institute for the Science of Light, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Schwefel, H. G. L., Koehler, W., Lu, Z. H., Fan, J., & Wang, L. J. (2008). Direct experimental observation of the single reflection optical Goos-Hanchen shift. OPTICS LETTERS, 33(8), 794-796. doi:10.1364/OL.33.000794.


Cite as: https://hdl.handle.net/11858/00-001M-0000-002D-6CAC-7
Abstract
We report a precise direct measurement of the Goos-Hanchen shift after one reflection off a dielectric interface coated with periodic metal stripes. The spatial displacement of the shift is determined by image analysis. A maximal absolute shift of 5.18 and 23.39 mu m for TE and TM polarized light, respectively, is determined. This technique is simple to implement and can be used for a large range of incident angles. (C) 2008 Optical Society of America.