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Cross-sectional TEM study on metal/carbon nanotube interface

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Jin-Phillipp,  N.Y.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Kelsch,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Sycha,  M.
Dept. New Materials and Biosystems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Thomas,  J.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Jin-Phillipp, N., Kelsch, M., Sycha, M., Thomas, J., & Rühle, M. (2004). Cross-sectional TEM study on metal/carbon nanotube interface. In I. Anderson, R. Price, E. Hall, E. Clark, & S. McKernan (Eds.), Proceedings Microscopy and Microanalysis 2004, Suppl. 2 (pp. 280CD-281CD). New York, USA: Press Syndicate of the University of Cambridge.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-28DD-4
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.