Quality analysis of selective microparticle deposition on electrically 
programmable surfaces

Wagner, J.; Löffler, Felix; König, K.; Fernandez, S.; Nesterov-Müller, A.; Breitling, F.; Bischoff, F. R.; Stadler, V.; Hausmann, M.; Lindenstruth, V.

doi:10.1063/1.3456986

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Quality analysis of selective microparticle deposition on electrically programmable surfaces

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Wagner, J., Löffler, F., König, K., Fernandez, S., Nesterov-Müller, A., Breitling, F., et al. (2010). Quality analysis of selective microparticle deposition on electrically programmable surfaces. Review of Scientific Instruments, 81(7): 073703. doi:10.1063/1.3456986.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002C-54D7-3

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