A combined top-down/bottom-up approach to the microscopic localization of 
metallic nanodots

Spatz, Joachim P.; Chan, Vanessa Z.-H.; Mößmer, Stefan; Kamm, Frank-Michael; Plettl, Alfred; Ziemann, Paul; Möller, Martin

doi:10.1002/adma.200290011

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A combined top-down/bottom-up approach to the microscopic localization of metallic nanodots

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Spatz, Joachim P.
Cellular Biophysics, Max Planck Institute for Medical Research, Max Planck Society;
Biophysical Chemistry, Institute of Physical Chemistry, University of Heidelberg, 69120 Heidelberg, Germany;

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Citation

Spatz, J. P., Chan, V.-Z.-H., Mößmer, S., Kamm, F.-M., Plettl, A., Ziemann, P., et al. (2002). A combined top-down/bottom-up approach to the microscopic localization of metallic nanodots. Advanced Materials, 14(24), 1827-1832. doi:10.1002/adma.200290011.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002A-17A7-1

Abstract

Periodic and aperiodic two-dimensional nanostructures with hierarchical order have been prepared by a combined top–down/bottom–up approach. This method allows 7 nm nanoparticles to be positioned with a accuracy of 10 nm or less, with a separation distance of several micrometers. The Figure is an optical dark field microscopy image of a square arrangement of Au dots on a Si wafer.