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The metrology system of the VLTI instrument GRAVITY

MPS-Authors
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Lippa,  Magdalena
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Gillessen,  Stefan
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Weber,  Johannes
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

/persons/resource/persons4782

Pfuhl,  Oliver
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Haug,  Marcus
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Kellner,  Stefan
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Wieprecht,  Ekkehard
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Eisenhauer,  Frank
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Genzel,  Reinhard
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Hans,  Oliver
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Haußmann,  Frank
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Huber,  David
MPI for Extraterrestrial Physics, Max Planck Society;

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Kratschmann,  Tobias
MPI for Extraterrestrial Physics, Max Planck Society;

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Ott,  Thomas
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Plattner,  Markus
MPI for Extraterrestrial Physics, Max Planck Society;

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Rau,  Christian
MPI for Extraterrestrial Physics, Max Planck Society;

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Sturm,  Eckhard
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Waisberg,  Idel
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Wiezorrek,  Erich
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Citation

Lippa, M., Gillessen, S., Blind, N., Kok, Y., Yazıcı, Ş., Weber, J., et al. (2016). The metrology system of the VLTI instrument GRAVITY. In F. Malbet, M. J. Creech-Eakman, & P. G. Tuthill (Eds.), Optical and Infrared Interferometry and Imaging V (pp. 1-9).


Cite as: https://hdl.handle.net/11858/00-001M-0000-002C-82F9-4
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