Carrier-Envelope-Phase-and Angle-resolved Photoelectron Streaking Measurements 
on W(110)

Schmidt, Jürgen; Guggenmos, Alexander; Chew, Soo Hoon; Gliserin, Alexander; Kleineberg, Ulf

doi:10.1364/CLEO_QELS.2016.FW1N.1

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Carrier-Envelope-Phase-and Angle-resolved Photoelectron Streaking Measurements on W(110)

MPS-Authors

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Guggenmos, Alexander
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons189088

Chew, Soo Hoon
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons127484

Gliserin, Alexander
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

/persons/resource/persons60616

Kleineberg, Ulf
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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引用

Schmidt, J., Guggenmos, A., Chew, S. H., Gliserin, A., & Kleineberg, U. (2016). Carrier-Envelope-Phase-and Angle-resolved Photoelectron Streaking Measurements on W(110). In 2016 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO). OSA.

引用: https://hdl.handle.net/11858/00-001M-0000-002C-A0A1-2

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