Sample-thickness dependence and chemical effects in SIMS depth profiling of 
multilayer Langmuir-Blodgett-films

Wittmaack, K.; Laxhuber, L.; Möhwald, Helmuth

doi:10.1016/S0168-583X(86)80102-1

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Sample-thickness dependence and chemical effects in SIMS depth profiling of multilayer Langmuir-Blodgett-films

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Wittmaack, K., Laxhuber, L., & Möhwald, H. (1987). Sample-thickness dependence and chemical effects in SIMS depth profiling of multilayer Langmuir-Blodgett-films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 18(4-6), 639-643. doi:10.1016/S0168-583X(86)80102-1.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002D-5373-C

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