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Correlated and simulated electron microscopy and atom probe tomography

MPS-Authors
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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Yao,  Mengji
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu,  Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Liebscher,  Christian
Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Herbig,  Michael
Materials Science of Mechanical Contacts, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Raabe, D., Gault, B., Yao, M., Scheu, C., Liebscher, C., & Herbig, M. (2017). Correlated and simulated electron microscopy and atom probe tomography. Talk presented at Workshop on Possibilities and Limitations of Quantitative Materials Modeling and Characterization 2017. Bernkastel, Germany. 2017-05-16.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002D-86A8-1
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