Evaluation of the spectroscopic ellipsometry and dielectric properties of Cr2O3 
nanoparticles doped PVDF thin films for future application of organic 
ferroelectric junctions

Al-Hazmi, F. S.; de Leeuw, Dago M.; Al-Ghamdi, A. A.; Shokr, F. S.

doi:10.1016/j.ijleo.2017.03.073

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Evaluation of the spectroscopic ellipsometry and dielectric properties of Cr2O3 nanoparticles doped PVDF thin films for future application of organic ferroelectric junctions

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de Leeuw, Dago M.
Dept. Blom: Molecular Electronics, MPI for Polymer Research, Max Planck Society;

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Al-Hazmi, F. S., de Leeuw, D. M., Al-Ghamdi, A. A., & Shokr, F. S. (2017). Evaluation of the spectroscopic ellipsometry and dielectric properties of Cr2O3 nanoparticles doped PVDF thin films for future application of organic ferroelectric junctions. Optik, 138, 207-213. doi:10.1016/j.ijleo.2017.03.073.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002D-87BF-9

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