English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse
  1. View item / 
  2. Item Summary

Item

ITEM ACTIONSEXPORT
Add to Basket
  Local TagsRelease HistoryDetailsSummary

Released
Journal Article

A Study on Fast Gates for Large-Scale Quantum Simulation with Trapped Ions

MPS-Authors
/persons/resource/persons204045

Bentley,  Christopher
Max Planck Institute for the Physics of Complex Systems, Max Planck Society;

External Resource

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5388870/
(Publisher version)

Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Taylor, R. L., Bentley, C., Pedernales, J. S., Lamata, L., Solano, E., Carvalho, A. R. R., et al. (2017). A Study on Fast Gates for Large-Scale Quantum Simulation with Trapped Ions. Scientific Reports, 7: 46197. doi:10.1038/srep46197.


Cite as: https://hdl.handle.net/11858/00-001M-0000-002D-ADC1-2
Abstract
Large-scale digital quantum simulations require thousands of fundamental entangling gates to construct the simulated dynamics. Despite success in a variety of small-scale simulations, quantum information processing platforms have hitherto failed to demonstrate the combination of precise control and scalability required to systematically outmatch classical simulators. We analyse how fast gates could enable trapped-ion quantum processors to achieve the requisite scalability to outperform classical computers without error correction. We analyze the performance of a large-scale digital simulator, and find that fidelity of around 70% is realizable for p-pulse infidelities below 10(-5) in traps subject to realistic rates of heating and dephasing. This scalability relies on fast gates: entangling gates faster than the trap period.