Aguiam, D. E., Silva, A., Bobkov, V., Carvalho, P. J., Carvalho, P. F., Cavazzana, R., Conway, G. D., D'Arcangelo, O., Fattorini,
L., Faugel, H., Fernandes, A., Fünfgelder, H., Goncalves, B., Guimarais, L., De Masi, G., Meneses, L., Noterdaeme, J.-M.,
Pereira, R. C., Rocchi, G., Santos, J. M., Tuccillo, A. A., Tudisco, O., & ASDEX Upgrade Team, Max Planck Institute for
Plasma Physics, Max Planck Society (2017). X-mode raw data
analysis for edge density profile measurements using the new ICRF antenna reflectometer on ASDEX Upgrade. Poster
presented at Ciencia 2017 – Annual Meeting of the Portuguese Science and Technology Community, Lisboa.
