X-mode raw data analysis for edge density profile measurements using the new 
ICRF antenna reflectometer on ASDEX Upgrade

Aguiam, D. E.; Silva, A.; Bobkov, V.; Carvalho, P. J.; Carvalho, P. F.; Cavazzana, R.; Conway, G. D.; D'Arcangelo, O.; Fattorini, L.; Faugel, H.; Fernandes, A.; Fünfgelder, H.; Goncalves, B.; Guimarais, L.; De Masi, G.; Meneses, L.; Noterdaeme, J.-M.; Pereira, R. C.; Rocchi, G.; Santos, J. M.; Tuccillo, A. A.; Tudisco, O.; ASDEX Upgrade Team, Max Planck Institute for Plasma Physics, Max Planck Society

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X-mode raw data analysis for edge density profile measurements using the new ICRF antenna reflectometer on ASDEX Upgrade

MPS-Authors

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Bobkov, V.
Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons108881

Conway, G. D.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons109063

Faugel, H.
Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons109129

Fünfgelder, H.
Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society;

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Noterdaeme, J.-M.
Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society;
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Citation

Aguiam, D. E., Silva, A., Bobkov, V., Carvalho, P. J., Carvalho, P. F., Cavazzana, R., et al. (2017). X-mode raw data analysis for edge density profile measurements using the new ICRF antenna reflectometer on ASDEX Upgrade. Poster presented at Ciencia 2017 – Annual Meeting of the Portuguese Science and Technology Community, Lisboa.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002D-A47A-E

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