Highly efficient soft X-ray spectrometer based on a reflection zone plate for 
resonant inelastic X-ray scattering measurements.

Yin, Z.; Rehanek, J.; Löchel, H.; Braig, C.; Buck, J.; Firsov, A.; Viefhaus, J.; Erko, A.; Techert, S.

doi:10.1364/OE.25.010984

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Highly efficient soft X-ray spectrometer based on a reflection zone plate for resonant inelastic X-ray scattering measurements.

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Techert, S.
Research Group of Structural Dynamics of (Bio)Chemical Systems, MPI for biophysical chemistry, Max Planck Society;

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Citation

Yin, Z., Rehanek, J., Löchel, H., Braig, C., Buck, J., Firsov, A., et al. (2017). Highly efficient soft X-ray spectrometer based on a reflection zone plate for resonant inelastic X-ray scattering measurements. Optics Express, 25(10), 10984-10996. doi:10.1364/OE.25.010984.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002D-B89B-3

Abstract

We present a newly designed compact and flexible soft X-ray spectrometer for resonant inelastic X-ray scattering (RIXS) studies within an energy range from 380 eV to 410 eV, which would include the K alpha emission lines of vital elements like nitrogen. We utilized an off-axis reflection zone plate (RZP) as the wavelength selective element with a maximum line density of 10000 l/mm. A higher energy resolution over a broader range of +/- 15 eV around the designed energy was achieved by displacing the RZP. Additionally, for the first time, an actual optical side effect, the so-called comatic aberration was exploited to increase the energy resolution. First results show a resolving power in the order of 1300 for photon energy of 395 eV, which is comparable to a commercial varied line spacing grating (VLS).