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Analysis of the full stress tensor in a micropillar: Ability of and difficulties arising during synchrotron based μLaue diffraction

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Davydok,  Anton
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Jaya,  Balila Nagamani
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kirchlechner,  Christoph
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Department of Materials Physics, Montanuniversität Leoben, Austria;

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Davydok, A., Jaya, B. N., Robach, O., Ulrich, O., Micha, J.-S., & Kirchlechner, C. (2016). Analysis of the full stress tensor in a micropillar: Ability of and difficulties arising during synchrotron based μLaue diffraction. Materials and Design, 108, 68-75. doi:10.1016/j.matdes.2016.06.098.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002D-B945-C
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