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Reflections on the Projection of Ions in Atom Probe Tomography

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Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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De Geuser, F., & Gault, B. (2017). Reflections on the Projection of Ions in Atom Probe Tomography. Microscopy and Microanalysis, 23(2), 238-246. doi:10.1017/S1431927616012721.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002D-C4B8-2
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