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In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire

MPS-Authors
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Hieke,  Stefan Werner
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Willinger,  Marc Georg
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Wang,  Zhu-Jun
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Richter,  Gunther
Dept. Physical Intelligence, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dehm,  Gerhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu,  Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Hieke, S. W., Willinger, M. G., Wang, Z.-J., Richter, G., Dehm, G., & Scheu, C. (2017). In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire. In M. Laue (Ed.), Microscopy Conference 2017 (MC 2017) - Proceedings. Regensburg: Universität Regensburg.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002E-059F-E
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