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On the Multiple Event Detection in Atom Probe Tomography

MPS-Authors
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Peng,  Zirong
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Peng, Z., Gault, B., Raabe, D., Ashton, M. W., Sinnott, S. B., Choi, P.-P., et al. (2017). On the Multiple Event Detection in Atom Probe Tomography. In MicroscopyMicroanalysis (pp. 618-619). doi:10.1017/S1431927617003762.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002E-0630-B
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