Real-Time Experimental Measurement of Swept Source VCSEL Properties Relevant to 
OCT Imaging

Butler, Thomas; Slepneva, S.; McNamara, P. M.; Neuhaus, K.; Goulding, D.; Leahy, M.; Huyet, G.

doi:10.1109/JPHOT.2017.2752644

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Real-Time Experimental Measurement of Swept Source VCSEL Properties Relevant to OCT Imaging

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Butler, Thomas
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Butler, T., Slepneva, S., McNamara, P. M., Neuhaus, K., Goulding, D., Leahy, M., et al. (2017). Real-Time Experimental Measurement of Swept Source VCSEL Properties Relevant to OCT Imaging. IEEE Photonics Journal, 9(5): 1505810. doi:10.1109/JPHOT.2017.2752644.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002E-2814-6

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