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Sekundärionen-Massenspektroskopie (SIMS) mittels FIB

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Motz, C., Kiener, D., Schöberl, T., Pippan, R., & Dehm, G. (2005). Sekundärionen-Massenspektroskopie (SIMS) mittels FIB. In W. Rom (Ed.), Handbuch der Nanoanalytik Steiermark, NanoNet Styria (1, pp. 1-311). Graz, Austria: W. Rom.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002E-281D-3
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