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Characterization of thin film displacements in the electron microscope

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Ramlau,  Reiner
Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Sawada, H., Ramlau, R., Allen, C. S., & Kirkland, A. I. (2017). Characterization of thin film displacements in the electron microscope. Applied Physics Letters, 111(20): 203104, pp. 1-5. doi:10.1063/1.4999003.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002E-55EE-6
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