Nanocrystallization in vanadium doped carbon films studied by means of X-Ray 
emission spectroscopy

Sikora, M.; Adelhelm, C.; Balden, M.; Schneider, K.; Kapusta, C.; Glatzel, P.

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Nanocrystallization in vanadium doped carbon films studied by means of X-Ray emission spectroscopy

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Adelhelm, C.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Balden, M.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Sikora, M., Adelhelm, C., Balden, M., Schneider, K., Kapusta, C., & Glatzel, P. (2008). Nanocrystallization in vanadium doped carbon films studied by means of X-Ray emission spectroscopy. Talk presented at 9th International School and Symposium on Synchrotron Radiation in Natural Science (ISSRNS 2008). Ameliowka. 2008-06-15 - 2008-06-20.

引用: https://hdl.handle.net/21.11116/0000-0000-1E2E-D

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