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A Comparison of the Electronic Structure of N–K in TiN and VN using EELS and Ab-initio Calculations

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Rashkova, B., Kothleitner, G., Šturm, S., Scheu, C., Kutschej, K., Mitterer, C., et al. (2007). A Comparison of the Electronic Structure of N–K in TiN and VN using EELS and Ab-initio Calculations. In Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie (pp. 414-415).


Cite as: https://hdl.handle.net/21.11116/0000-0000-0557-9
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