Polarization and phase-shifting interferometry for arbitrary, locally varying 
polarization states

Rothau, Sergej; Kellermann, Christine; Mayer, Simon; Mantel, Klaus; Lindlein, Norbert

doi:10.1364/AO.56.001422

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Polarization and phase-shifting interferometry for arbitrary, locally varying polarization states

MPS-Authors

/persons/resource/persons201123

Mantel, Klaus
Optical Technologies, Technology Development and Service Units, Max Planck Institute for the Science of Light, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Rothau, S., Kellermann, C., Mayer, S., Mantel, K., & Lindlein, N. (2017). Polarization and phase-shifting interferometry for arbitrary, locally varying polarization states. APPLIED OPTICS, 56(5), 1422-1430. doi:10.1364/AO.56.001422.

Cite as: https://hdl.handle.net/21.11116/0000-0000-7DF2-3

Abstract

This publication presents what we believe is a novel interferometric method for the simultaneous measurement of the phase and state of polarization of a light wave with arbitrary polarization; in particular, it can be varying elliptical. The measurement strategy is based on variations of the reference wave, concerning phase and polarization and processing the interference patterns so obtained. With this method, which is very similar to classical phase-shifting interferometry, the general analysis of spatially variant states of polarization and their phase fronts can be done in one measurement cycle. Furthermore, the analysis of different optical elements regarding the impact on the polarization and phase of the incoming light can be realized. After the theoretical description of the method and the mathematical discussion of different algorithms, the realized measurement setup is presented. Afterward, the accuracy of the method is discussed.(C) 2017 Optical Society of America