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Joint Characterization of Crystallography and Chemistry on the Nanometer Scale by Correlative Electron Microscopy and Atom Probe Tomography

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Herbig,  Michael
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Herbig, M. (2016). Joint Characterization of Crystallography and Chemistry on the Nanometer Scale by Correlative Electron Microscopy and Atom Probe Tomography. Talk presented at Interdisciplinary Symposium on 3D Microscopy, Congress Center, Les Diablerets. Les Diablerets, Switzerland. 2016-10-18 - 2016-10-21.


Cite as: http://hdl.handle.net/21.11116/0000-0000-3E1F-A
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