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Comparison of power deposition profiles during ELMs using Langmuir probes and Infra-Red Camera diagnostic at JET

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Eich,  T.
Tokamak Edge and Divertor Physics (E2), Max Planck Institute for Plasma Physics, Max Planck Society;

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Jachmich, S., Eich, T., & Fundamenski, W. (2009). Comparison of power deposition profiles during ELMs using Langmuir probes and Infra-Red Camera diagnostic at JET. Poster presented at 36th EPS Conference on Plasma Physics, Sofia.


Cite as: http://hdl.handle.net/21.11116/0000-0000-5008-D
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